Test / Data Acq.
Expert Knowledge On Strain Gages Accessible Online |
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Friday, 10 November 2006 |
HBM has the answers to questions on using strain gages. There are three ways to access relevant information:
1. The HBM Online Knowledge Centre: Backed by the know-how of HBM experts, this 24/7 support resource includes a comprehensive frequently asked questions (FAQs) section offering insight into using strain gages in experimental stress analysis.
2. ‘An Introduction to Measurements using Strain Gages’ by Karl Hoffmann: This definitive work on strain gage measurement is offered by HBM with an easy to use search function, including full-text search, that makes it easy to find the right information. Topics include strain gage selection, the basics of experimental stress analysis, the wiring of strain gages, consideration of errors, and minimizing the effects of errors.
3. Strain gage installation video: A step-by-step video guide to installing a strain gage and protecting it from environmental influences....more  (0) Comments |
Agilent, The MathWorks Team On Scopes |
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Tuesday, 07 November 2006 |
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Agilent Technologies and The MathWorks have combined forces to offer the latter's MATLAB math-based signal-processing software on Infiniium Oscilloscopes from Agilent. Agilent's Infiniium oscilloscopes are now available with the N5430A user-definable function option which allows users to create and execute application-specific measurements. The option is a collaboration of Agilent and The MathWorks, and makes it possible for Infiniium users to develop custom math and analysis functions in the MATLAB software environment and execute them live on the oscilloscope screen....more (0) Comments |
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Test Methods Identify Small Delay Defects |
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Friday, 03 November 2006 |
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Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the biggest challenges for design for test (DFT) and test engineers is how to improve test quality without dramatically increasing the cost of test. At 130nm, DFT-based at-speed testing was adopted as a mainstream test technique to meet DPPM goals. Now at 90nm and below, more advanced at-speed tests are needed to maintain and even improve on the quality levels achieved at 130nm. In this article we will present a revolutionary approach in ATPG technology to improve at-speed testing....more (0) Comments |
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Color Enhances Inspection Results |
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Friday, 03 November 2006 |
You need to do more than swap out the camera to turn a monochrome vision system into one that uses color. For most machine-vision applications, monochrome—or gray-scale—images provide sufficient information about component placement, orientation, and shape. In some cases, though, color images add an extra “dimension” that improves inspection results....more (0) Comments
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DSOs Find And Display Anomalous Waveforms |
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Tuesday, 31 October 2006 |
One of the most frustrating aspects of using a digital scope to diagnose intermittent malfunctions in a UUT (unit under test) is that, to get the scope to display the anomalous waveforms, you generally must describe to it what is unusual about those waveforms. However, until you can see the anomalies, you can't describe them. Is the problem a runt pulse, a slow or misplaced edge, a unit interval of slightly incorrect length? You don't know … and, because a quick glance at a large group of waveforms may reveal nothing unusual, even scopes that let you use normal waveforms to create a trigger mask often fail to provide the needed insights.
Many EEs are likely to characterize the WaveScan feature of LeCroy's WaveSurfer and WaveRunner series of large screen, small-footprint (6-in.-deep) digital oscilloscopes as the ultimate scope-based troubleshooting aid, based on the degree of automation the feature brings to the identification of elusive malfunctions....more (0) Comments |
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Cisco Applies Test Strategy Globally |
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Thursday, 26 October 2006 |
As companies expand globally, far-flung internal engineering groups, including test, must find ways to work remotely. The senior director of manufacturing test engineering at Cisco Systems detailed his company's "trust but verify" strategy for test. Develop partnerships with various contract manufacturers and component suppliers, Greg Jordan urges, and engender a set of tools called "autotest" that enable test engineers to have a test network that links all engineering, contract manufacturers and suppliers into a single data net....more (0) Comments
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