Test / Data Acq.
Measuring Power Corruption |
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Tuesday, 13 March 2007 |
Power monitoring is undertaken for a variety of reasons: to determine the cause of a power-related problem, to confirm that the supply can support added loads, to gather data that might aid in reducing power use, and to verify power quality. Depending on the goal, different types of power monitoring equipment are appropriate....more  (0) Comments |
Rohde & Schwarz Finalizes Complete Set Of Assisted-GPS Interoperability Tests |
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Tuesday, 13 March 2007 |
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Rohde & Schwarz announced that it has finalized a complete set of interoperability test cases for Assisted-GPS (A-GPS), the mobile phone location capability that is part of the federally-mandated E911 systems being implemented by wireless carriers in the US. Rohde & Schwarz claims it is now the world's only company that has created and received verification for all A-GPS test cases defined by GCF Work Item WI-015 specified by the Global Certification Forum (GCF). The interoperability test cases are designed to be used with the company's R&S CRTU-W protocol tester....more (0) Comments |
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How To Achieve 100% Visibility With FPGA-Based ASIC Prototypes Running At Real-Time Speeds |
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Tuesday, 06 March 2007 |
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TotalRecall technology provides a way to run FPGA-based ASIC prototypes at real-time hardware speeds while providing 100% visibility of internal signals and memory. High-performance, high-capacity FPGAs continue to experience an exponential growth in usage, both in their role as prototypes for ASIC and SoC designs and as systems in their own right. These designs typically involve complex combinations of hardware and embedded software (and also, possibly, application software). This is resulting in a verification crisis, because detecting, isolating, debugging, and correcting bugs now consumes significantly more time, money, and engineering resources than creating the design in the first place....more (0) Comments |
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Measurement System Designed For FlexRay |
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Monday, 05 March 2007 |
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Agilent Technologies and Dependable Computer Systems GmbH (DECOMSYS) have introduced a measurement system that is said to provide the highest-level FlexRay triggering and protocol decode measurements available in an oscilloscope. This oscilloscope-based measurement system allows automotive designers who use embedded microprocessors to verify proper signal integrity of their FlexRay signals and proper timing of the time-triggered communication bus. The measurement system combines an Agilent 6000 Series mixed-signal oscilloscope (MSO) with a DECOMSYS::BUSDOCTOR 2 protocol analyzer to provide the first time-correlated slot/segment boundary display of the global FlexRay timing schedule on an oscilloscope, according to the two companies....more (0) Comments |
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"Extreme" Research In Semiconductor Nanostructures |
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Thursday, 01 March 2007 |
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The demand for increasingly smaller, faster and more powerful electronic devices has created interest in materials with superior properties, such as carbon nanotubes (CNTs) and quantum dots. This, in turn, is driving the need for characterization tools that accurately analyze their novel physical qualities....more (0) Comments |
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Metrology Meets Next-Generation Challenges — Barely |
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Thursday, 01 March 2007 |
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Next-generation metrology faces many issues, not the least of which are the complexities of the etch structures being created and considered for 45 and 32 nm. Next-generation transistors will have considerably more vertical structures — finFETs, for example. These involve complex etch shapes to wrap the gate around the channel. Another important facet is the introduction of new materials and how they react to one another and to traditional ones already in use. High-k dielectrics will bring their own helping of headaches....more (0) Comments |
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