Test / Data Acq.
Solver Selections Required For Solving High-Frequency Electromagnetic Field Problems |
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Tuesday, 24 April 2007 |
The method of moments (MoM) or the finite element method (FEM) can be used to solve electromagnetic field (EMF) problems. For open region problems like antennas, the use of MoM is more appropriate, whereas FEM is adequate for closed region problems like microwave cavities and networks. A team of engineering and software professionals designed the software program SINGULA to help solve a wide variety of high-frequency EMF problems. In the program the user has the option to choose the solver type depending up on the nature of the problem. A generalized hybrid method, that combines the MoM with the physical optics (PO) technique and the fast Fourier transform (FFT) method to speed up the matrix-vector multiplication, are implemented. This enables the solution of electrically large models. In this article, the formulations of these different methods along with an appropriate example for each of the method are presented....more  (0) Comments |
Popularly Priced DSOs Aim To Outsell Market Leader |
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Friday, 20 April 2007 |
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According to Agilent Technologies, Tektronix’s lunchbox-sized TDS3000 series remains the world’s largest-selling oscilloscope family based on the number of units sold. Because of the TDS3000s’ low prices, however, the series is probably not the market leader in revenues. Nevertheless, Agilent aims to wrest the unit-sales crown from the TDS3000s. To do so, Agilent has introduced the 5000 Series. The 5000s’ cases are about the same size as those of the TDS3000s. The modest-sized screens are equal in size, although Agilent says that, by enabling users to switch off the on-screen display of soft-key legends, the 5000s can use more of the LCD to display waveforms. Hence, says Agilent, its units can present a bigger picture of what you buy a scope to see: waveforms....more (0) Comments |
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What Factors Are Affecting Growth In Synthetic Instrumentation |
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Friday, 13 April 2007 |
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Synthetic instrumentation (SI) has been a prominent buzzword in the test and measurement industry over the last few years, and with good reason. The aerospace and defense (A&D) industry continues to be the largest driver for growth in the market, but SI contains inherent benefits that make it extremely attractive to commercial industries as well....more (0) Comments |
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Understanding The Basics Of Image And Carrier Suppression Measurements |
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Thursday, 12 April 2007 |
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In an ideal world, a 16-bit, 20 GSamples/s digital-to-analog converter (DAC) would generate accurate RF signals for a variety of modern communications protocols. However, ASICs with this kind of performance are still an RF engineer's dream. As a result, today's wireless devices require a series of DACs and RF mixers to convert digital baseband signals into the RF domain. Most RF transmitters use one of two upconversion approaches: the heterodyne upconversion or homodyne (direct) upconversion approach....more (0) Comments |
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The WiMax Boom: It's Not All Magic |
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Thursday, 12 April 2007 |
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Along with the compelling advantages of WiMAX, system operators and equipment vendors must be prepared to tackle some new technical challenges.This white paper from Rohde & Schwarz details the ins and outs of testing WiMAX systems...more (0) Comments |
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Should You Migrate Test Applications To Windows Vista? |
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Wednesday, 11 April 2007 |
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Windows Vista is here, and almost every new PC comes with it. It’s an abrupt change from Windows XP, bringing sweeping changes much in the way Windows 95 did to prior versions. Just like Windows 95 started the migration from 16 bit to 32 bit, Vista starts the transition to 64 bit. But this time, you have a choice of a 32-bit version or a 64-bit version. Furthermore, new security enhancements may also hinder the transition to Vista. You should, therefore, understand the issues you face in migrating your test and measurement applications, and most importantly, your GPIB and VISA drivers....more (0) Comments |
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