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   Linewidth Measurement Systems

The spectral linewidth characterises the width of a peak in the spectrum of a system, e.g. of an optical spectrum or of the frequency spectrum in an acoustic or electronic system. For example, the emission of an atom usually has a very thin spectral linewidth, as only transitions between discrete energy levels are allowed, leading to emission of photons with a certain energy.

Several definitions are used to quantify the spectral linewidth, e.g. the Full width at half maximum (FWHM).

Whereas the spectral width of a resonator in electronics depends on the parameters of the used components and therefore can be adjusted according to the wishes of the engineer, things are different in physics. Even a resting atom which does not interact with its environment has a non-zero linewidth, called the natural linewidth, which is a consequence of the transform limit (classical description) and the Heisenberg uncertainty principle (quantum mechanical description). This linewidth is a fundamental property of atomic emission and cannot be adjusted arbitrarily (see Homogeneity (physics)).



Bronze Partners
E. Licht Co./North Central Instruments
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Operations Technology
Veeco Instruments Inc.
Fix & Prog. Sinewave Oscillators - Frequency Devices

 

Books
Frequency Measurement and Control: Advanced Techniques and Future Trends (Topics in Applied Physics)
Andre N. Luiten

Excerpt - page 180: "... [87]. In 1998, improvements of the apparatus led to observed linewidths of 80 Hz [125] (natural linewidth 6 Hz), making such measurements among the highest resolutions reported to date. 7.6 The In+ Single-Ion System As in the case of the Hg+ single-ion system, the ..."
See more references to Linewidth Measurement Systems in this book.
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems (SuDoc C 13.10:260-129)
James E. Potzick

Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems (SuDoc C 13.10:260-117)
Carol F. Vezzetti

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems standard reference materials (SuDoc C 13.10:260-119)
Carol F. Vezzetti

Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems (SuDoc C 13.10:260-114)
Carol F. Vezzetti

Measurement and Manipulation of Intracellular Ions, Volume 27 (Methods in Neurosciences)
P. Michael Conn

Excerpt - page 165: "... signals in the case of slow exchange. In these biological systems, the linewidths observed are considerably broadened by many factors, and hence it would be impossible to make measurements under conditions of intermediate exchange. The deesterified indicators are small ..."
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Advanced Light Microscopy : Measuring Techniques (Haken, H//Light)
M. Pluta

Excerpt - page 43: "... measurements at micrometre dimensions, including development of coherent photometric microscope systems for photomasks and wafers. Most commercially available linewidth measurement systems utilize a slit in front of a photomultiplier tube ..."
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Electronic Filters, Amplifiers & Oscillators - Frequency Devices
Electronic Filters, Amplifiers & Oscillators - Frequency Devices
Electronic Filters, Amplifiers & Oscillators - Frequency Devices
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